Measurement of multimegohm resistors

NIST Measurement Service for DC Standard Resistors

At the National Institute of Standards and Technology (NIST), the U.S. representation of the ohm is based on the quantum Hall effect, and it is maintained and disseminated at various resistance levels by working reference groups of standards. This document describes the measurement systems and procedures used to calibrate standard resistors and current shunts of nominal decade values in the res...

Measurement and Performance of Chip Resistors and Terminations

Measurement of 1/f Noise in Carbon Composition and Thick Film Resistors

Thermal noise and 1/f noise are known to exist in carbon composition (CC) and thick film (TF) resistors. A circuit involving a differential instrumentation op-amp was used to measure the noise of a resistor under test. The noise spectra of these resistors were measured using a dynamic signal analyzer that performs an auto-correlation Fourier transform from the time domain to the frequency domai...

Carbon nanotube quantum resistors

The conductance of multiwalled carbon nanotubes (MWNTs) was found to be quantized. The experimental method involved measuring the conductance of nanotubes by replacing the tip of a scanning probe microscope with a nanotube fiber, which could be lowered into a liquid metal to establish a gentle electrical contact with a nanotube at the tip of the fiber. The conductance of arc-produced MWNTs is o...

Modeling Diffusion Resistors

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